In this second test cell integration session, we hear specialized test solutions that target very specific requirements. Jason Mroczkowski, Xcerra, describes a complete test cell for high volume manufacturing (HVM) that meets the challenges of RF testing for next generation automotive radar devices. Bob Bartlett, Advantest, describes a universal device interface (UDI) framework that can be used by test engineers to quickly integrate any kind of PCB evaluation board or device interface for characterization, bring-up, and HVM. Roger Sinsheimer, Teradyne, explains how to extend existing ATE test instruments in new ways for specialized test requirements for niche markets solutions.
"A Test-Cell-Solution for 81GHz Automotive Radar ICs"
Jason Mroczkowski, Peter Cockburn, John Shelley
"Universal Device Interface DUT Solutions for ATE Test"
"Where No Tester Has Gone Before"
Return to the 2015 BiTS Workshop Archive index page