Designing and manufacturing contactors for burn-in and test has not gotten easier as operating conditions become harsher, performance requirements increase, pitches become finer, and pressure for lower cost continues. This session features novel methods for addressing these issues. AJ Park, IWIN, presents a one-piece spring probe in a one-piece socket housing that offers a low cost, high performance socket solution. Cho provides details acquired through the research and developments (R&D) process. Justin Yun, TSE, discusses replacing spring pins with a MEMS rubber contact test socket. He also describes the MEMS process used to create the powder for the rubber socket production to provide the electrical interconnect.
"One piece spring probes in one piece house socket (The best cost socket solution)"
AJ Park, JD Cho
IWIN Co. Ltd.
"MEMS rubber contact for TEST socket"
Justin Yun, BoHyun Kim
TSE Co., Ltd.
Predicting any market requires a mix of technical understanding, research, a little pixie dust, and possibly some blarney. This year’s marketplace session features Ira Feldman, Feldman Engineering and BiTS Workshop General Chair, sharing a test and burn-in marketplace update. John West, VLSI Research, provides a review of strategic issues facing socket suppliers and several upcoming critical decisions.
Feldman Engineering Corp.
"A Testing Time for Test Socket Suppliers"
Return to the 2015 BiTS Workshop Archive index page