Simulation and modeling of performance is one of the most crucial design tasks for developing test hardware. It is essential to ensure the highest possible performance from wafer probes, sockets, contactors, and printed circuit boards. Mohammed Eldessouki, SV Probe, details the importance of implementing electrical performance simulation of the probe head on a semiconductor wafer probe card using SPICE based simulators. Gert Hohenwarter, GateWave Northern, reviews characterization and use of Kelvin sockets at RF frequencies. He explains that the proper design and analysis of the test environment requires knowledge of the input and output parameters of the DUT. Don Thompson, R&D Altanova, discusses measuring a socket at very high frequencies and the rational for this methodology. Jose Moreira, Advantest, reviews a 32 Gbps application that presents challenges for PCB test fixture and socket design. Jose describes the ATE system measurements results and improvements required.
"Electrical circuit model for silicon wafer spring pin probe"
"Kelvin Sockets at Speed"
GateWave Northern, Inc.
"Designing Sockets for Ludicrous Speed (80 GHz)"
"PCB Test Fixture and DUT Socket Challenges for 32 Gbps/GBaud ATE Applications"
Christian Borelli, Fulvio Corneo
Return to the 2015 BiTS Workshop Archive index page