It's been three and a half days packed with learning, exploring, and sharing. Before we pack our bags and take what we've learned back to our jobs, there are a few closing remarks. We will take a moment to reflect and recognize the people, presentations, and posters that have distinguished themselves at BiTS 2015.
"Advanced Kelvin Test Solution for Wafer Level Chip Packages"
Leeno Industrial Inc.
"PCB Test Fixture and DUT Socket Challenges for 32 Gbps/GBaud ATE Applications"
Christian Borelli, Fulvio Corneo
Most Inspirational Presentation
"APEX Glass for Burn-In and Test Sockets"
Jeb H. Flemming, Tim Foster
3D Glass Solutions, Inc.
Best Presentation - Tutorial
"Comparison of Different Methods in Determining Current Carrying Capacity of Semiconductor Test Contacts"
"BURst Pressure (BURP) Stress Test for MEMS Pressure Sensors"
Peter Jones & Ray Sessego
"Designing Sockets for Ludicrous Speed (80 GHz)"
Return to the 2015 BiTS Workshop Archive index page