Please join us for the 4th annual BiTS events in China!
半导体芯片“老化及性能测试技术研讨会”Burn-in and Test Strategies (BiTS) China Workshop即将拉开帷幕! 我们很荣幸地宣布2018年的BiTS研讨会更名为TestConX中国，并将在苏州、深圳举办两场研讨会， 旨在为业内精英提供信息交流平台，期盼各位就与行业相关的主题展开广泛且深入的讨论。
October 23, 2018 (Tuesday) - Suzhou, China
October 25, 2018 (Thursday) - Shenzhen, China
To stay informed on the program please sign up for our mailing list.
For assistance in Mandarin please contact /
郭晶 / Misu Guo
Phone: +86 189-1896-7485
Many thanks to the attendees and exhibitors who made BiTS 2018 a success! Our nineteenth annual event brought together over four hundred fifty participants to learn what is Now & Next in test and burn-in.
It was a very full program of presentations with everything from high-frequency test to burn-in to socket technology to test cell integration. And much more!
The presentations and multi-media recordings (audio recordings synchronized with the slides) are available in the 2018 Premium Archive now.
Looking to follow up with a BiTS EXPO exhibitor? Please see the BiTS EXPO directory.
Many thanks to everyone who made our third annual China event a success! BiTS China 2017 returned to Shanghai this year and was very popular.
It was a very informative day with a full program of presentations on RF & High Speed testing, SiP Test, and contact technology.
The presentations and multi-media recordings (audio recordings synchronized with the slides) will be available in the Premium Archive shortly.
Please see the BiTS China EXPO directory to follow up with the great exhibitors.